MS 5022-0

Brief

目的是讓學生了解電子顯微鏡學、顯微鏡解析度、電子散射機制，電子顯微鏡成像原理，描穿透式電子顯微鏡，能譜分析儀 等，使學生對電子顯微鏡學有基本的認識與了解。上學期主要以中文授課, 下學期以英文授課。 The class provides the student basic knowledge on transmission electron microscopy including, structure and resolution, elastic scattering of electrons, diffraction, imaging in TEM, STEM and Spectroscopy.The main ob<x>ject of the class is to understand the basic concepts and language of transmission electron microscopy used in materials science engineering. Note that the class will be provided in English this semester.

Description

Course keywords: 電子顯微鏡學、顯微鏡解析度、電子散射機制，電子顯微鏡成像原理，描穿透式電子顯微鏡，能譜分析儀,structure and resolution, elastic scattering of electrons, diffraction, imaging in TEM, STEM and Spectroscopy 一、課程說明(Course Description) 目的是讓學生了解電子顯微鏡學、顯微鏡解析度、電子散射機制，電子顯微鏡成像原理，描穿透式電 子顯微鏡，能譜分析儀等，使學生對電子顯微鏡學有基本的認識與了解。 The class provides the student basic knowledge on transmission electron microscopy including, structure and resolution, elastic scattering of electrons, diffraction, imaging in TEM, STEM and Spectroscopy.The main object of the class is to understand the basic concepts and language of transmission electron microscopy used in materials science engineering. Note that the class will be provided in Chinese this semester. 二、指定用書(Text Books) Class slides 三、參考書籍(References) Transmission Electron Microscopy, David B. Williams, C Barry Carter, Springer. ISBN:978-0-387-76500-6 四、教學方式(Teaching Method) 投影片教學 Slide teaching will be provided during whole class. 五、教學進度(Syllabus) Ch 1_Introduction Ch 2_Structure and Resolution Ch 3_Elastic Scattering of Electrons Ch 4_Diffraction I Ch 5_Diffraction II Ch 6_Imaging Ch 7_STEM Ch 8_Spectroscopy 六、成績考核(Evaluation) 作業: 30% 期中考: 35 % 期未考: 35 % Homework (20 %) midterm (40 %) final (40 %)

Timetable

Scores

Average Percentage 86.02

Std. Deviation 10.51

Remarks

本課程上150分鐘,其餘時間由教授視情形彈性運用

Restrictions

半導體學院,材料系,前瞻產博學程優先，第3次選課起開放全校修習

Compulsory

Elective

Cross Discipline

First Specialization

Second Specialization